VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon) (The Morgan Kaufmann Series in Systems on Silicon)

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Product Description

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.


· Most up-to-date coverage of design for testability.
� Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Lecture slides and exercise solutions for all chapters are now available.
� Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon) (The Morgan Kaufmann Series in Systems on Silicon) Review

This is a great book for Test/DFT engineers and EDA engineers developing test tool. It gives a thorough review of lot of concepts and techniques employed in practice which cannot be found if you look at a general testing book. This also makes it an excellent resource to prepare for interviews.

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